PC Motion Controller Offers Board-Level Solution for Semiconductor Wafer Inspection System

Nova Measuring Instruments of Rechovot, Israel, approached. ACS-Tech80 for assistance in developing a control system for their integrated monitoring system used during the chemical-mechanical polishing (CMP) process.

Using a nonlinear control technique, our SB214PC motion controller provided the NovaScan 210’s optical measuring head with the needed accuracy and speed.